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Modern Research and Educational Topics in Microscopy
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SYSNO ASEP 0094363 Document Type M - Monograph Chapter R&D Document Type Monograph Chapter Title Very Low Energy Scanning Electron Microscopy Title Rastrovací elektronová mikroskopie na velmi nízkých energiích Author(s) Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Frank, Luděk (UPT-D) RID, SAI, ORCIDSource Title Modern Research and Educational Topics in Microscopy , 2. - Badajoz : Formatex, 2007 / Méndez-Vilas A. ; Diaz J. - ISBN 978-84-611-9420-9 Pages s. 795-804 Number of pages 10 s. Language eng - English Country ES - Spain Keywords electron optics ; scanning electron microscopy ; low energy electrons ; cathode lens mode ; surfaces Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering R&D Projects GA102/05/2327 GA ČR - Czech Science Foundation (CSF) GA202/04/0281 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z20650511 - UPT-D (2005-2011) Annotation The method of very low energy scanning electron microscopy below about 50 eV is treated in full, starting from physics of interaction of very slow electrons with solids, through principle of deceleration of the primary electron beam in the SEM by means of the cathode lens and properties of this assembly, description of contrast mechanisms, up to presentation of results of demonstration experiments performed on families of samples important in various branches of materials science. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2008
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