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Modern Research and Educational Topics in Microscopy

SYSNO ASEP	0094363
Document Type	M - Monograph Chapter
R&D Document Type	Monograph Chapter
Title	Very Low Energy Scanning Electron Microscopy
Title	Rastrovací elektronová mikroskopie na velmi nízkých energiích
Author(s)	Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Source Title	Modern Research and Educational Topics in Microscopy , 2. - Badajoz : Formatex, 2007 / Méndez-Vilas A. ; Diaz J. - ISBN 978-84-611-9420-9
Pages	s. 795-804
Number of pages	10 s.
Language	eng - English
Country	ES - Spain
Keywords	electron optics ; scanning electron microscopy ; low energy electrons ; cathode lens mode ; surfaces
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
R&D Projects	GA102/05/2327 GA ČR - Czech Science Foundation (CSF)
	GA202/04/0281 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
Annotation	The method of very low energy scanning electron microscopy below about 50 eV is treated in full, starting from physics of interaction of very slow electrons with solids, through principle of deceleration of the primary electron beam in the SEM by means of the cathode lens and properties of this assembly, description of contrast mechanisms, up to presentation of results of demonstration experiments performed on families of samples important in various branches of materials science.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2008

Number of the records: 1