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Microwave plasma ion sources for selected ion flow tube mass spectrometry: Optimizing their performance and detection limits for trace gas analysis
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SYSNO ASEP 0088033 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Ostatní články Title Microwave plasma ion sources for selected ion flow tube mass spectrometry: Optimizing their performance and detection limits for trace gas analysis Title Mikrovlnné plazmatické iontové zdroje pro hmotnostní spektrometrii v proudové trubici s vybranými ionty. Optimalizace jejich výkonnosti a detekčních limitů pro analýzu stopových plynů Author(s) Španěl, Patrik (UFCH-W) RID, ORCID
Dryahina, Kseniya (UFCH-W) RID, ORCID
Smith, D. (GB)Source Title International Journal of Mass Spectrometry. - : Elsevier - ISSN 1387-3806
Roč. 267, 1-3 (2007), s. 117-124Number of pages 8 s. Language eng - English Country NL - Netherlands Keywords microwave plasma ion source ; selected ion flow tube mass spectrometry ; SIFT-MS ; breath analysis Subject RIV CF - Physical ; Theoretical Chemistry R&D Projects GA202/06/0776 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z40400503 - UFCH-W (2005-2011) DOI 10.1016/j.ijms.2007.02.023 Annotation The performance of the ion sources used in selected ion flow tube mass spectrometry, SIFT-MS, instruments is paramount in determining their sensitivities and detection limits for trace gas analysis. The microwave discharge plasma ion source that is currently used for the production of currents of the precursor H3O+, NO+ and O2+ ions for SIFT-MS is described, and the ion chemistry occurring within the plasma and the dissociation of the precursor ions on the helium carrier gas are considered. Thus, it is shown that the most suitable ion source gas composition is a mixture comprising maximal water vapour and minimal air at the lowest total pressure at which the discharge is sustained and stable. It is also shown that the injection energies of the precursor ions into the helium carrier gas must be kept low to minimize collisional dissociation of the ions and thus to minimize the fraction of reactive impurity ions in the carrier gas. Workplace J. Heyrovsky Institute of Physical Chemistry Contact Michaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196 Year of Publishing 2008
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