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MDFT program: calculation of 2D and 1D diffraction patterns from electron micrographs

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    SYSNO ASEP0020811
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JOstatní články
    TitleMDFT program: calculation of 2D and 1D diffraction patterns from electron micrographs
    TitleProgram MDFT: výpočet 2D a 1D difrakčních obrazů ze SM mikrofotografií
    Author(s) Šlouf, Miroslav (UMCH-V) RID, ORCID
    Synková, Hana (UMCH-V) RID
    Baldrian, Josef (UMCH-V)
    Source TitleMaterials Structure in Chemistry, Biology, Physics and Technology - ISSN 1211-5894
    Roč. 12, č. 2 (2005), s. 85-89
    Number of pages5
    ActionColloquium of Crystallographic Society : Structure
    Event date20.06.2005-23.06.2005
    VEvent locationTřešť
    CountryCZ - Czech Republic
    Event typeEUR
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordstwo-dimensional Fourier transform ; image analysis ; ultra-high molecular weight polyethylene
    Subject RIVCF - Physical ; Theoretical Chemistry
    R&D ProjectsGA106/04/1118 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z40500505 - UMCH-V (2005-2011)
    AnnotationMDFT program, described in this work, calculates discrete Fourier transform of grayscale electron micrographs, yielding results in the form of 2D-image or 1D-graphs. Scanning electron micrographs (SEM), which showed crystalline and amorphous regions in UHMWPE polymer were processed by MDFT and long period (LP) was calculated. The values of LP from MDFT were comparable with those obtained from small-angle X-ray scattering (SAXS).
    WorkplaceInstitute of Macromolecular Chemistry
    ContactEva Čechová, cechova@imc.cas.cz ; Tel.: 296 809 358
    Year of Publishing2006
Number of the records: 1