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Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride

  1. 1.
    Tkachenko, V. - Lipp, V. - Buescher, M. - Capotondi, F. - Hoeppner, H. - Medvedev, Nikita - Pedersoli, E. - Prandolini, M.J. - Rossi, G.M. - Tavella, F. - Toleikis, S. - Windeler, M. - Ziaja, B. - Teubner, U.
    Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride.
    Scientific Reports. Roč. 11, č. 1 (2021), č. článku 5203. ISSN 2045-2322. E-ISSN 2045-2322
    OECD category: Fluids and plasma physics (including surface physics)
    Impact factor: 4.997, year: 2021
    Method of publishing: Open access
    http://hdl.handle.net/11104/0322052
Number of the records: 1  

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