Number of the records: 1
Determination of thickness refinement using STEM detector segments
- 1.Skoupý, Radim - Krzyžánek, Vladislav
Determination of thickness refinement using STEM detector segments.
10th Anniversary International Conference on Nanomaterials - Research and Application (NANOCON 2018). Ostrava: Tanger, 2019, s. 677-681. ISBN 978-80-87294-89-5.
[Anniversary International Conference on Nanomaterials - Research and Application (NANOCON) /10./. Brno (CZ), 17.10.2018-19.10.2018]
OECD category: Electrical and electronic engineering
http://hdl.handle.net/11104/0309122
Number of the records: 1