Number of the records: 1
Profilometry of thin films on rough substrates by Raman spectroscopy
- 1.Ledinský, Martin - Paviet-Salomon, B. - Vetushka, Aliaksi - Geissbühler, J. - Tomasi, A. - Despeisse, M. - De Wolf, S. - Ballif, C. - Fejfar, Antonín
Profilometry of thin films on rough substrates by Raman spectroscopy.
Scientific Reports. Roč. 6, Dec (2016), s. 1-7, č. článku 37859. ISSN 2045-2322. E-ISSN 2045-2322
Impact factor: 4.259, year: 2016
http://hdl.handle.net/11104/0267018
Number of the records: 1