Number of the records: 1
Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass
- 1.Vaněček, Milan - Holovský, Jakub - Poruba, Aleš - Remeš, Zdeněk - Purkrt, Adam
Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass.
Praha: Tel Solar AG, Trübbach, Switzerland, 2015. 22 s.
Source of funding: N - Non-public resources
http://hdl.handle.net/11104/0258426
Number of the records: 1