Number of the records: 1
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon
- 1.Verveniotis, Elisseos - Rezek, Bohuslav - Šípek, Emil - Stuchlík, Jiří - Kočka, Jan
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon.
Thin Solid Films. Roč. 518, č. 21 (2010), s. 5965-5970. ISSN 0040-6090. E-ISSN 1879-2731
Impact factor: 1.909, year: 2010
http://hdl.handle.net/11104/0193834
Number of the records: 1