Number of the records: 1
Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources
- 1.Krása, Josef - Láska, Leoš - Rohlena, Karel - Velyhan, Andriy - Czarnecka, A. - Parys, P. - Ryc, L. - Wolowski, J.
Limits of applicability of a time-of-flight ion-mass analyzer in uncovering partial currents of ions emitted by pulsed laser ion sources.
Radiation Effects and Defects in Solids. Roč. 165, 6-10 (2010), s. 441-450. ISSN 1042-0150. E-ISSN 1029-4953
Impact factor: 0.660, year: 2010
http://hdl.handle.net/11104/0192061
Number of the records: 1