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Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy
- 1.Pavluch, J. - Zommer, L. - Mašek, K. - Skála, T. - Šutara, F. - Nehasil, V. - Píš, I. - Polyak, Yaroslav
Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy.
Analytical Sciences. Roč. 26, č. 2 (2010), s. 209-215. ISSN 0910-6340. E-ISSN 1348-2246
Impact factor: 1.465, year: 2010
http://hdl.handle.net/11104/0185884
Number of the records: 1