Number of the records: 1
Profiling N-Type Dopants in Silicon
- 1.Hovorka, Miloš - Mika, Filip - Mikulík, P. - Frank, Luděk
Profiling N-Type Dopants in Silicon.
Materials Transactions. Roč. 51, č. 2 (2010), s. 237-242. ISSN 1345-9678. E-ISSN 1347-5320
Impact factor: 0.779, year: 2010
http://www.jim.or.jp/journal/e/51/02/237.html
http://hdl.handle.net/11104/0183926
Number of the records: 1