Number of the records: 1
A high resolution x-ray spectrometer utilizing Kirkpatrick-Baez optics and off-plane gratings
- 1.McEntaffer, R.L. - Hudec, René - Murray, N.J. - Holland, A.D.
A high resolution x-ray spectrometer utilizing Kirkpatrick-Baez optics and off-plane gratings.
EUV and X-Ray Optics: Synergy between Laboratory and Space. Bellingham: SPIE, 2009 - (Hudec, R.; Pina, L.), 736014-1-736014-10. Proceedings of SPIE, 7360. ISBN 9780819476340. ISSN 0277-786X.
[EUV and X-Ray Optics: Synergy between Laboratory and Space. Prague (CZ), 20.04.2009-22.04.2009]
http://hdl.handle.net/11104/0183377
Number of the records: 1