Number of the records: 1
Novel instrumentation for interferometric nanoscale comparator
- 1.Čížek, Martin - Buchta, Zdeněk - Mikel, Břetislav - Lazar, Josef - Číp, Ondřej
Novel instrumentation for interferometric nanoscale comparator.
Optical Measurement Systems for Industrial Inspection VI. (Proceedings of SPIE Vol. 7389). Bellingham: SPIE, 2009, 73982Y: 1-7. ISBN 978-0-8194-7672-2. ISSN 0277-786X.
[Optical Measurement Systems for Industrial Inspection /6./. Munich (DE), 14.06.2009-18.06.2009]
http://hdl.handle.net/11104/0179660
Number of the records: 1