Number of the records: 1
Crystallographic properties of grain size-controlled polycrystalline silicon thin films deposited on alumina substrate
- 1.Ogane, A. - Honda, Shinya - Uraoka, Y. - Fuyuki, T. - Fejfar, Antonín - Kočka, Jan
Crystallographic properties of grain size-controlled polycrystalline silicon thin films deposited on alumina substrate.
Journal of Crystal Growth. Roč. 311, č. 3 (2009), s. 789-793. ISSN 0022-0248. E-ISSN 1873-5002
Impact factor: 1.534, year: 2009
http://hdl.handle.net/11104/0172268
Number of the records: 1