Number of the records: 1
Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM
- 1.Sorbello, F. - Hughes, G.M. - Lejček, Pavel - Heard, P.J. - Flewitt, P.E.J.
Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM.
Ultramicroscopy. Roč. 109, č. 2 (2009), 147-153. ISSN 0304-3991. E-ISSN 1879-2723
Impact factor: 2.067, year: 2009
http://hdl.handle.net/11104/0170530
Number of the records: 1