Number of the records: 1
Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System
- 1.Frank, Luděk - Zadražil, Martin - Müllerová, Ilona
Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System.
Scanning. Roč. 23, č. 1 (2001), s. 36-50. ISSN 0161-0457. E-ISSN 1932-8745
Impact factor: 0.389, year: 2001
http://hdl.handle.net/11104/0100991
Number of the records: 1