Number of the records: 1
Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF
- 1.Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 95-96.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
OECD category: Electrical and electronic engineering
http://hdl.handle.net/11104/0314731
Number of the records: 1