Number of the records: 1
Very Low Energy Electron Transmission Spectro-Microscopy
- 1.Daniel, Benjamin - Zouhar, Martin - Radlička, Tomáš - Piňos, Jakub - Materna Mikmeková, Eliška - Konvalina, Ivo - Frank, Luděk - Müllerová, Ilona
Very Low Energy Electron Transmission Spectro-Microscopy.
Microscopy Conference: MC 2019. Abstracts. Berlin: DSE, 2019. s. 609-610.
[Microscopy Conference : MC 2019. 01.09.2019-05.09.2019, Berlin]
OECD category: Electrical and electronic engineering
https://www.microscopy-conference.de
http://hdl.handle.net/11104/0300821
Number of the records: 1