Number of the records: 1
About the information depth of backscattered electron imaging
- 1.Piňos, Jakub - Mikmeková, Šárka - Frank, Luděk
About the information depth of backscattered electron imaging.
Journal of Microscopy. Roč. 266, č. 3 (2017), s. 335-342. ISSN 0022-2720. E-ISSN 1365-2818
OECD category: Materials engineering
Impact factor: 1.693, year: 2017
http://hdl.handle.net/11104/0273494
Number of the records: 1