Number of the records: 1
Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes
- 1.Jirák, J. - Čudek, P. - Neděla, Vilém
Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes.
Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I10.14: 1-2. ISBN 978-85-63273-06-2.
[International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
http://hdl.handle.net/11104/0192396
Number of the records: 1