Number of the records: 1
RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI
- 1.Macková, Anna - Bočan, Jiří - Khaibullin, R. I. - Švorčík, V. - Slepička, P. - Siegel, J. - Valeev, V. F.
RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI.
16th International Conference on Ion Beam Modification of Materials Book of Abstracts. Dresden: Institute of Ion Beam Physics and Materials Research, Forschungzentrum Dresden-Rossendorf, 2008. s. 317-317.
[16th International Conference on Ion Beam Modification of Materials. 31.08.2008-05.09.2008, Dresden]
http://hdl.handle.net/11104/0165889
Number of the records: 1