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Low frequency noise and I-V characteristic as characterization tools for 2.3 µm CW GaSb based laser diodes
- 1.Vaněk, J. - Brzokoupil, V. - Chobola, Z. - Hulicius, Eduard - Šimeček, Tomislav
Low frequency noise and I-V characteristic as characterization tools for 2.3 µm CW GaSb based laser diodes.
Research Activities of Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republics. Brno: Brno University of Technology, 2004 - (Pazdera, L.; Kořenská, M.), s. 184-186. ISBN 80-7204-353-6.
[International Workshop on Research Activities of Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republics. Brno (CZ), 14.09.2004-16.09.2004]
http://hdl.handle.net/11104/0011499
Number of the records: 1