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In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires
- 1.0365167 - FZÚ 2012 RIV CH eng J - Journal Article
Malard, B. - Pilch, Jan - Šittner, Petr - Delville, R. - Curfs, C.
In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires.
Solid State Phenomena. 172-174, č. 6 (2011), s. 1243-1248. ISSN 1012-0394
R&D Projects: GA AV ČR(CZ) IAA200100627; GA MŠMT(CZ) LA10010
Institutional research plan: CEZ:AV0Z10100520
Keywords : recovery process * electropulse treatment * in-situ analysis * superelasticity
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0200473
Number of the records: 1