A New Characterization of ACC(0) and Probabilistic CC0

0352500 - MÚ 2011 RIV CH eng J - Journal Article
Hansen, A. K. - Koucký, Michal
A New Characterization of ACC(0) and Probabilistic CC0.
Computational Complexity. Roč. 19, č. 2 (2010), s. 211-234. ISSN 1016-3328. E-ISSN 1420-8954.
[24th Annual IEEE Conference on Computational Complexity. Paris, 15.07.2009-18.07.2009]
R&D Projects: GA ČR GAP202/10/0854; GA MŠMT(CZ) 1M0545; GA AV ČR IAA100190902
Institutional research plan: CEZ:AV0Z10190503
Keywords : bounded depth circuits * counting circuits * arithmetic circuits * complexity classes
Subject RIV: BA - General Mathematics
Impact factor: 1.450, year: 2010
http://link.springer.com/article/10.1007%2Fs00037-010-0287-z

Permanent Link: http://hdl.handle.net/11104/0191994