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Low Energy Reflection and High Angle Reflection of Electrons in the SEM

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    0352416 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
    Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk
    Low Energy Reflection and High Angle Reflection of Electrons in the SEM.
    Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I3.7: 1-2. ISBN 978-85-63273-06-2.
    [International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
    R&D Projects: GA MŠMT OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning electron microscopy * crystallinic structure * slow backscattered electrons
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

    Permanent Link: http://hdl.handle.net/11104/0191924
     
Number of the records: 1  

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