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Semiconductor laser sources at 760 nm wavelength for nanometrology
- 1.0352185 - ÚPT 2011 RIV BG eng C - Conference Paper (international conference)
Mikel, Břetislav - Buchta, Zdeněk - Lazar, Josef - Číp, Ondřej
Semiconductor laser sources at 760 nm wavelength for nanometrology.
Proceedings of the 9th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronic. Sofia: WSEAS EUROPMENT Press, 2010, s. 96-101. ISBN 978-954-92600-3-8. ISSN 1790-5117.
[WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronic /9./. Catania (IT), 29.05.2010-31.10.2010]
R&D Projects: GA MPO 2A-1TP1/127; GA MŠMT ED0017/01/01; GA ČR GP102/09/P293; GA ČR GP102/09/P630
Institutional research plan: CEZ:AV0Z20650511
Keywords : laser interferometry * absolute measurement * tunable laser diodes
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0191758
Number of the records: 1