3D characterization of material structure using scanning electron microscopy (SEM) and focused ion beam (FIB)

0351718 - FZÚ 2011 RIV CZ eng C - Conference Paper (international conference)
Hradilová, Monika - Jäger, Aleš - Lejček, Pavel
3D characterization of material structure using scanning electron microscopy (SEM) and focused ion beam (FIB).
Metal 2010 - 19th international conference on metallurgy and materials. Ostrava: Tanger s.r.o, 2010, s. 152-153. ISBN 978-80-87294-15-4.
[Metal 2010. Rožnov pod Radhoštěm (CZ), 18.05.2010-20.05.2010]
Institutional research plan: CEZ:AV0Z10100520
Keywords : scanning electron microscopy * focused ion beam * 3D characterization
Subject RIV: BM - Solid Matter Physics ; Magnetism

Permanent Link: http://hdl.handle.net/11104/0191410