Number of the records: 1
Grain Contrast Imaging in UHV SLEEM
- 1.0340746 - ÚPT 2010 RIV JP eng J - Journal Article
Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Man, O. - Pantělejev, L. - Frank, Luděk
Grain Contrast Imaging in UHV SLEEM.
Materials Transactions. Roč. 51, č. 2 (2010), s. 292-296. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * electron backscatter diffraction (EBSD) * grain contrast * ultra-fine grained materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.779, year: 2010
http://www.jim.or.jp/journal/e/51/02/292.html
Permanent Link: http://hdl.handle.net/11104/0183927
Number of the records: 1