Number of the records: 1
Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
- 1.0338185 - FZÚ 2010 RIV NL eng A - Abstract
Holovský, Jakub - Ižák, T. - Poruba, Aleš - Vaněček, Milan - Hamers, E.A.G.
Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates.
[Fourierovské fotovodivostní měření tenkých vrstev amorfního křemíku na hrubých opticky neprůhledných a vodivých substrátech.]
ICANS23 - 23rd International Conference on Amorphous and Nanocrystaline Semiconductors. Book of Abstracts. Utrecht: Utrecht University, 2009. s. 332-332. ISBN N.
[International Conference on Amorphous and Nanocrystaline Semiconductors /23./ (ICANS23). 23.08.2009-28.08.2009, Utrecht]
R&D Projects: GA ČR GA202/09/0417
EU Projects: European Commission(XE) 38885 - SE-POWERFOIL
Institutional research plan: CEZ:AV0Z10100521
Keywords : thin film silicon * photoconductivity * optical modeling
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0182026
Number of the records: 1