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Laser sources at 760 nm wavelength for metrology of length
- 1.0336817 - ÚPT 2011 RIV US eng C - Conference Paper (international conference)
Mikel, Břetislav - Buchta, Zdeněk - Lazar, Josef - Číp, Ondřej
Laser sources at 760 nm wavelength for metrology of length.
Africon 2009. Los Alamitos: IEEE, 2009, 5308091: 1-6. ISBN 978-1-4244-3918-8.
[Africon 2009. Nairobi (KE), 23.09.2009-25.09.2009]
R&D Projects: GA MŠMT(CZ) LC06007; GA MŠMT 2C06012; GA AV ČR KAN311610701; GA MPO 2A-1TP1/127; GA MPO FT-TA3/133; GA MPO 2A-3TP1/113; GA ČR GA102/07/1179; GA ČR GP102/09/P293; GA ČR GP102/09/P630; GA ČR GA102/09/1276
Institutional research plan: CEZ:AV0Z20650511
Keywords : laser interferometry * absolute measurement * tunable laser diodes
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0180969
Number of the records: 1