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Noise Spectroscopy in Micro-wave Material Structute Examinatlon
- 1.0336722 - ÚPT 2010 RIV US eng C - Conference Paper (international conference)
Kubásek, R. - Drexler, P. - Fiala, P. - Bartušek, Karel
Noise Spectroscopy in Micro-wave Material Structute Examinatlon.
PIERS 2009 Moscow: Progess in Electromagnetics Research Symposium - Proceedings. Cambridge: Electromagnetics Academy, 2009, s. 1118-1121. ISBN 978-1-934142-10-3. ISSN 1559-9450.
[Progress in Electromagnetics Research Symposium 2009 Moscow. Moscow (RU), 18.08.2009-21.08.2009]
R&D Projects: GA ČR GA102/09/0314
Institutional research plan: CEZ:AV0Z20650511
Keywords : Noise Spectroscopy * Material Structute
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0180898
Number of the records: 1