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Scanning low energy electron microscopy of doped silicon at units of eV
- 1.0335882 - ÚPT 2011 IT eng A - Abstract
Hovorka, Miloš - Mikmeková, Šárka - Frank, Luděk
Scanning low energy electron microscopy of doped silicon at units of eV.
6th International Workshop on LEEM/PEEM. Trieste: ELETTRA, 2008. s. 110. ISBN N.
[International Workshop on LEEM/PEEM /6./. 07.09.2008-11.09.2008, Trieste]
R&D Projects: GA AV ČR IAA100650803
Institutional research plan: CEZ:AV0Z20650511
Keywords : very low energy electron microscopy * scanning low energy electron microscope
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0180232
Number of the records: 1