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Mapping the Local Density of States by Very Low Energy Scanning Electron Microscope
- 1.0335298 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
Pokorná, Zuzana - Frank, Luděk
Mapping the Local Density of States by Very Low Energy Scanning Electron Microscope.
Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009 - (Pokorná, Z.; Mika, F.), s. 26. ISBN 978-80-254-4535-8.
[CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./. Brno (CZ), 10.08.2009-14.08.2009]
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopes * polycrystalline aluminium
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0179804
Number of the records: 1