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Microstructure of the ultra-fine grained Cu by UHV SLEEM
- 1.0335272 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk - Man, O. - Pantělejev, L.
Microstructure of the ultra-fine grained Cu by UHV SLEEM.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 3: 515-516. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
R&D Projects: GA MŠMT OE08012
Institutional research plan: CEZ:AV0Z20650511
Keywords : scanning low energy electron microscopy * EBSD * grain contrast in SEM * ultrafine grained materials
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/25482.pdf
Permanent Link: http://hdl.handle.net/11104/0179781
Number of the records: 1