Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry

0538509 - FZÚ 2021 RIV GB eng J - Journal Article
Richter, Steffen - Herrfurth, O. - Espinoza Herrera, Shirly J. - Rebarz, Mateusz - Kloz, Miroslav - Leveillee, J.A. - Schleife, A. - Zollner, S. - Grundmann, M. - Andreasson, Jakob - Schmidt-Grund, R.
Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry.
New Journal of Physics. Roč. 22, č. 8 (2020), s. 1-15, č. článku 083066. ISSN 1367-2630. E-ISSN 1367-2630
R&D Projects: GA MŠMT EF16_019/0000789; GA MŠMT EF15_003/0000447; GA MŠMT LQ1606
Grant - others:OP VVV - ADONIS(XE) CZ.02.1.01/0.0/0.0/16_019/0000789; OP VVV - ELIBIO(XE) CZ.02.1.01/0.0/0.0/15_003/0000447
Research Infrastructure: ELI Beamlines III - 90141
Institutional support: RVO:68378271
Keywords : ZnO * time-resolved ellipsometry * ultrafast dynamics * thin oxides * oxide * semiconductor * dielectric function
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 3.732, year: 2020
Method of publishing: Open access
Permanent Link: http://hdl.handle.net/11104/0316308