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Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl

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    0481772 - FZÚ 2018 RIV US eng J - Journal Article
    Kopeček, Jaromír - Jurek, Karel - Kopecký, Vít - Klimša, Ladislav - Seiner, Hanuš - Sedlák, Petr - Landa, Michal - Dluhoš, J. - Petrenec, M. - Hladík, L. - Doupal, A. - Heczko, Oleg
    Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl.
    Microscopy and Microanalysis. Roč. 20, Aug (2014), s. 335-336. ISSN 1431-9276
    R&D Projects: GA ČR(CZ) GA14-03044S
    Institutional support: RVO:68378271 ; RVO:61388998
    Keywords : scanning electron microscope * SEM * focused ion beam * FIB * xenon plasma focused ion beam * dual beam * shape memory alloy * SMA
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    OBOR OECD: Condensed matter physics (including formerly solid state physics, supercond.)
    Impact factor: 1.872, year: 2014
    Permanent Link: http://hdl.handle.net/11104/0277259
     
Number of the records: 1