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About the information depth of backscattered electron imaging

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    0477097 - ÚPT 2018 RIV GB eng J - Journal Article
    Piňos, Jakub - Mikmeková, Šárka - Frank, Luděk
    About the information depth of backscattered electron imaging.
    Journal of Microscopy. Roč. 266, č. 3 (2017), s. 335-342. ISSN 0022-2720. E-ISSN 1365-2818
    Institutional support: RVO:68081731
    Keywords : backscattered electrons * information depth * penetration of electrons
    OECD category: Materials engineering
    Impact factor: 1.693, year: 2017
    Permanent Link: http://hdl.handle.net/11104/0273494
     
     
Number of the records: 1  

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