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Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.
- 1.0469204 - ÚFP 2017 RIV US eng J - Journal Article
Germer, S. - Pietag, F. - Polák, Jaroslav - Arnold, T.
Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.
Review of Scientific Instruments. Roč. 87, č. 11 (2016), č. článku 113301. ISSN 0034-6748. E-ISSN 1089-7623.
[Topical Conference on High-Temperature Plasma Diagnostics/21./. Madison, 05.06.2016-09.06.2016]
Institutional support: RVO:61389021
Keywords : Current density * Etching * Faraday cups * Ion beam sources * Cameras
OECD category: 2.11 Other engineering and technologies
Impact factor: 1.515, year: 2016
http://aip.scitation.org/doi/full/10.1063/1.4964701
Permanent Link: http://hdl.handle.net/11104/0267029File Download Size Commentary Version Access Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.pdf 2 3.5 MB Publisher’s postprint require
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