Profilometry of thin films on rough substrates by Raman spectroscopy

0469174 - FZÚ 2017 RIV GB eng J - Journal Article
Ledinský, Martin - Paviet-Salomon, B. - Vetushka, Aliaksi - Geissbühler, J. - Tomasi, A. - Despeisse, M. - De Wolf, S. - Ballif, C. - Fejfar, Antonín
Profilometry of thin films on rough substrates by Raman spectroscopy.
Scientific Reports. Roč. 6, Dec (2016), s. 1-7, č. článku 37859. ISSN 2045-2322. E-ISSN 2045-2322
R&D Projects: GA MŠMT LM2015087; GA ČR GA14-15357S
EU Projects: European Commission(XE) 727523 NextBase
Institutional support: RVO:68378271
Keywords : solar cells * surfaces * interfaces and thin films * two-dimensional materials
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 4.259, year: 2016
Permanent Link: http://hdl.handle.net/11104/0267018