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Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon
- 1.0354945 - FZÚ 2011 RIV CH eng J - Journal Article
Verveniotis, Elisseos - Rezek, Bohuslav - Šípek, Emil - Stuchlík, Jiří - Kočka, Jan
Role of current profiles and atomic force microscope tips on local electric crystallization of amorphous silicon.
Thin Solid Films. Roč. 518, č. 21 (2010), s. 5965-5970. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA ČR GD202/09/H041; GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA MŠMT LC510
Institutional research plan: CEZ:AV0Z10100521
Keywords : amorphous materials * atomic force microscopy (AFM) * conductivity * crystallization * nanostructures * silicon * nickel
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.909, year: 2010
Permanent Link: http://hdl.handle.net/11104/0193834
Number of the records: 1