Number of the records: 1
Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy
- 1.0343393 - ÚFCH JH 2011 RIV JP eng J - Journal Article
Pavluch, J. - Zommer, L. - Mašek, K. - Skála, T. - Šutara, F. - Nehasil, V. - Píš, I. - Polyak, Yaroslav
Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy.
Analytical Sciences. Roč. 26, č. 2 (2010), s. 209-215. ISSN 0910-6340. E-ISSN 1348-2246
Institutional research plan: CEZ:AV0Z40400503
Keywords : non-evaporable getter materials * XPS methods
Subject RIV: CF - Physical ; Theoretical Chemistry
Impact factor: 1.465, year: 2010
Permanent Link: http://hdl.handle.net/11104/0185884
Number of the records: 1