Number of the records: 1
Scintillation secondary electron detector for variable pressure scanning electron microscope
- 1.0335266 - ÚPT 2010 RIV AT eng C - Conference Paper (international conference)
Čudek, P. - Jirák, Josef - Neděla, Vilém
Scintillation secondary electron detector for variable pressure scanning electron microscope.
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Graz: Verlag der Technischen Universität, 2009, Vol. 1: 221-222. ISBN 978-3-85125-062-6.
[MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./. Graz (AT), 30.08.2009-04.09.2009]
Institutional research plan: CEZ:AV0Z20650511
Keywords : scintillation SE detector * variable pressure SEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://www.univie.ac.at/asem/Graz_MC_09/papers/95710.pdf
Permanent Link: http://hdl.handle.net/11104/0179776
Number of the records: 1