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Calculation of aberration coefficients by ray tracing
- 1.0333615 - ÚPT 2010 RIV NL eng J - Journal Article
Oral, Martin - Lencová, Bohumila
Calculation of aberration coefficients by ray tracing.
Ultramicroscopy. Roč. 109, č. 11 (2009), s. 1365-1373. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA AV ČR IAA100650805
Institutional research plan: CEZ:AV0Z20650511
Keywords : Aberrations * Aberration coefficients * Ray tracing * Regression * Fitting
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.067, year: 2009
Permanent Link: http://hdl.handle.net/11104/0178557
Number of the records: 1