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Temperature and ambient atmosphere dependent electrical characterization of sputtered IrO.sub.2./sub./TiO.sub.2./sub./IrO.sub.2./sub. capacitors
SYS 0561797 LBL 01000a^^22220027750^450 005 20240103230912.1 014 $a 85126355780 $2 SCOPUS 014 $a 000772778300011 $2 WOS 017 70
$a 10.1063/5.0080139 $2 DOI 100 $a 20221004d m y slo 03 ba 101 0-
$a eng 102 $a US 200 1-
$a Temperature and ambient atmosphere dependent electrical characterization of sputtered IrO2/TiO2/IrO2 capacitors 215 $a 11 s. 463 -1
$1 001 cav_un_epca*0256872 $1 011 $a 0021-8979 $e 1089-7550 $1 200 1 $a Journal of Applied Physics $v Roč. 131, č. 9 (2022) $1 210 $c AIP Publishing 608 $a Article 610 $a IrO2/TiO2/IrO2 capacitors 610 $a dielectric properties 610 $a temperature dependence 700 -1
$3 cav_un_auth*0401559 $a Maier $b F.J. $y AT 701 -1
$3 cav_un_auth*0401560 $a Schneider $b M. $y AT 701 -1
$3 cav_un_auth*0300754 $a Artemenko $b Anna $p FZU-D $i Polovodiče $j Semiconductors $T Fyzikální ústav AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0100328 $a Kromka $b Alexander $p FZU-D $i Polovodiče $j Semiconductors $T Fyzikální ústav AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0437265 $a Stoeger-Pollach $b M. $y AT 701 -1
$3 cav_un_auth*0401564 $a Schmid $b U. $y AT 856 $u https://hdl.handle.net/11104/0334300 $9 RIV
Number of the records: 1