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Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof
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$a Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof 210 $d 2021 610 $a spectrometry 610 $a beam intensity profile diagnostics 610 $a XUV 610 $a X-rays 700 -1
$3 cav_un_auth*0256138 $a Nejdl $b Jaroslav $p FZU-D $i ELI Beamlines $j ELI Beamlines $w Laser Physics at ELI Beamlines $T Fyzikální ústav AV ČR, v. v. i. 856 $u https://worldwide.espacenet.com/patent/search/family/060327011/publication/US10914628B2?q=US10914628B2 $9 RIV
Number of the records: 1