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Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry
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$a 10.1088/1367-2630/aba7f3 $2 DOI 100 $a 20210125d m y slo 03 ba 101 0-
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$a Ultrafast dynamics of hot charge carriers in an oxide semiconductor probed by femtosecond spectroscopic ellipsometry 215 $a 15 s. 300 $a USER ELI Beamlines III 463 -1
$1 001 cav_un_epca*0257957 $1 011 $a 1367-2630 $e 1367-2630 $1 200 1 $a New Journal of Physics $v Roč. 22, č. 8 (2020), s. 1-15 $1 210 $c Institute of Physics Publishing 608 $a Article 610 $a ZnO 610 $a time-resolved ellipsometry 610 $a ultrafast dynamics 610 $a thin oxides 610 $a oxide 610 $a semiconductor 610 $a dielectric function 700 -1
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Number of the records: 1