Number of the records: 1
Determination of thickness refinement using STEM detector segments
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$2 DOI 100 $a 20200610d m y slo 03 ba 101 0-
$a eng $d eng 102 $a CZ 200 1-
$a Determination of thickness refinement using STEM detector segments 215 $a 5 s. $c P 463 -1
$1 001 cav_un_epca*0536215 $1 010 $a 978-80-87294-89-5 $1 200 1 $a 10th Anniversary International Conference on Nanomaterials - Research and Application (NANOCON 2018) $v S. 677-681 $1 210 $a Ostrava $c Tanger $d 2019 608 $a Proceedings Paper 610 $a electron-microscopy 610 $a Quantitative STEM 610 $a thickness determination 610 $a detector segments 610 $a Monte Carlo simulation 700 -1
$3 cav_un_auth*0323997 $a Skoupý $b Radim $p UPT-D $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0286053 $a Krzyžánek $b Vladislav $p UPT-D $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $w Electron Microscopy $T Ústav přístrojové techniky AV ČR, v. v. i.
Number of the records: 1