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Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer
SYS 0494380 LBL 01000a^^22220027750^450 005 20240103220624.3 014 $a 000450591400034 $2 WOS 017 $2 DOI 100 $a 20181011d m y slo 03 ba 101 $a eng $d eng 102 $a CZ 200 1-
$a Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer 215 $a 2 s. $c P 463 -1
$1 001 cav_un_epca*0494358 $1 010 $a 978-80-87441-23-7 $1 200 1 $a Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar $v S. 86-87 $1 210 $a Brno $c Institute of Scientific Instruments The Czech Academy of Sciences $d 2018 610 $a electron microscopy 610 $a time of flight 610 $a inelastic mean free path 610 $a low energy 700 -1
$3 cav_un_auth*0363252 $a Zouhar $b Martin $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $p UPT-D $w Electron Microscopy $y CZ $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0222137 $a Radlička $b Tomáš $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $p UPT-D $w Electron Microscopy $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0101603 $a Oral $b Martin $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $p UPT-D $w Electron Microscopy $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0101580 $a Konvalina $b Ivo $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $p UPT-D $w Electron Microscopy $T Ústav přístrojové techniky AV ČR, v. v. i.
Number of the records: 1