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The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation
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$a The use of Raman spectroscopy for the monitoring of changes in the glass structure of the thin layers caused by ion implantation 215 $a 7 s. $c P 463 -1
$1 001 cav_un_epca*0256369 $1 011 $a 0862-5468 $e 1804-5847 $1 200 1 $a Ceramics - Silikáty $v Roč. 59, č. 3 (2015), s. 187-193 $1 210 $c University of Chemistry and Technology Prague 610 $a glasses 610 $a nano particles 610 $a Raman spectroscopy 610 $a ion implantation 700 -1
$3 cav_un_auth*0014733 $a Nekvindová $b P. $y CZ 701 -1
$3 cav_un_auth*0204820 $a Švecová $b B. $y CZ 701 -1
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$3 cav_un_auth*0316103 $a Vytykačová $b S. $y CZ 701 -1
$3 cav_un_auth*0100958 $a Macková $b Anna $i Oddělení neutronové fyziky $j Department of Neutron Physics $k ONF $p UJF-V $w Research with Beams of Ions and Neutrons $T Ústav jaderné fyziky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0227604 $a Malinský $b Petr $i Oddělení neutronové fyziky $j Department of Neutron Physics $k ONF $p UJF-V $w Research with Beams of Ions and Neutrons $T Ústav jaderné fyziky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0017942 $a Machovič $b V. $y CZ 701 -1
$3 cav_un_auth*0020609 $a Špirková $b J. $y CZ
Number of the records: 1